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X-Ray Diffraction

The principle of diffraction is applied to record interference on a subatomic level in the study of x-ray crystallography.

Key Points

    • Diffraction is what happens when waves encounter irregularities on a surface or object and are caused to interfere with each other, either constructively or destructively.
    • The Bragg law pertains to applying the laws of diffraction to crystallography in order to obtain precise images of the lattice structures in atoms.
    • The x-ray diffractometer is the machine used to scan the object by shooting a wave at it and recording the interference it encounters.
    • Most XRDs are equipped with a Soller slit, which acts like a polarizer for the incident beam. It makes sure that the incident beam being recorded is perfectly parallel to the object being analyzed.

Terms

  • destructive interference

    Occurs when waves interfere with each other crest to trough (peak to valley) and are exactly out of phase with each other.

  • crystallography

    The experimental science of determining the arrangement of atoms in solids.

  • constructive interference

    Occurs when waves interfere with each other crest to crest and the waves are exactly in phase with each other.


Full Text

X-ray diffraction was discovered by Max von Laue, who won the Nobel Prize in physics in 1914 for his mathematical evaluation of observed x-ray diffraction patterns.

Diffraction is the irregularities caused when waves encounter an object. You have most likely observed the effects of diffraction when looking at the bottom of a CD or DVD. The rainbow pattern that appears is a result of the light being interfered by the pits and lands on the disc that hold the data. shows this effect. Diffraction can happen to any type of wave, not just visible light waves.

Bragg Diffraction

In x-ray crystallography, the term for diffraction is Bragg diffraction, which is the scattering of waves from a crystalline structure. William Lawrence Bragg formulated the equation for Bragg's law, which relates wavelength to the angle of incidence and lattice spacing. Refer to for a diagram of the following equation: $n\lambda = 2d sin(\theta)$

  • n - numeric constant known as the order of the diffracted beam
  • λ - wavelength
  • d - distance between lattice planes
  • θ - angle of diffracted wave

The waves will experience either constructive interference or destructive interference. Similarly, the x-ray beam that is diffracted off a crystal will have some parts that have stronger energy, and others that lose energy. This depends on the wavelength and the lattice spacing.

The X-ray Diffractometer

The XRD machine uses copper metal as the element for the x-ray source. Diffraction patterns are recorded over an extended period of time, so it is very important that the beam intensity remains constant. Film used to be used to record the data, but that was inconvenient because it had to be replaced often. Now the XRD machines are equipped with semiconductor detectors. These XRD machines record images in two ways, either continuous scans or step scanning. In continuous scans, the detector moves in circular motions around the object, while a beam of x-ray is constantly shot at the detector. Pulses of energy are plotted with respect to diffraction angle. The step scan method is the more popular method. It is much more efficient than continuous scans. In this method, the detector collects data at a single fixed angle at a time. To ensure that the incident beam is continuous, XRD machines are equipped with a Soller slit. This acts like polarized sunglasses by organizing random x-ray beams into a stack of neatly arranged waves parallel to the plane of the detector.

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